Nickel oxide interlayer films from nickel formate–ethylenediamine precursor: influence of annealing on thin film properties and photovoltaic device performance - Concepedia

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Publication | Open Access

Nickel oxide interlayer films from nickel formate–ethylenediamine precursor: influence of annealing on thin film properties and photovoltaic device performance

DOI Full Paper Access

51

Citations

70

References

2015

Year

K. Xerxes Steirer, Ryan M. Richards, Ajaya K. Sigdel, Paul F. Ndione, Scott R. Hammond, Darick Baker, Erin L. Ratcliff, Calvin J. Curtis, T. E. Furtak, David S. Ginley,

Journal of Materials Chemistry A

Thin Film PhysicsEngineeringOptoelectronic DevicesThin Film Process TechnologyChemistryChemical DepositionCharge TransportPhotovoltaicsNanoelectronicsNickel Formate–ethylenediamine PrecursorNanoscale ScienceThin Film ProcessingMaterials ScienceElectrical EngineeringNanoscale SystemNanotechnologyOxide ElectronicsElectrical PropertyElectrochemistryPhotovoltaic Device PerformanceFunctional NanomaterialsNanomaterialsNatural SciencesApplied PhysicsThin Film PropertiesThin FilmsSolar Cell Materials

Abstract

Decomposition/oxidation correlated to nanoscale c-AFM helps separate selectivity and conductivity.

References

	Year	Citations

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