Concepedia

Determination of chromium on metal surfaces by prompt proton spectrometry

C. Olivier, M. Peisach

Journal of Radioanalytical and Nuclear Chemistry · 1970 · 12 citations · 2 references

DOI

Concepts

References

2

ION IMPLANTATION OF SILICON: I. ATOM LOCATION AND LATTICE DISORDER BY MEANS OF 1.0-MeV HELIUM ION SCATTERING

John Davies, J. Denhartog, L. Eriksson et al. · Canadian Journal of Physics · 1967 · 274 citations

, , +17

Determination of alumina film thickness by alpha particle scattering

M. Peisach, Darrell O. Poole, Hermann F. Röhm · Talanta · 1967 · 17 citations

, , +12