A model for current oscillations in the Si-HF system based on a quantitative analysis of current transients - Concepedia

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A model for current oscillations in the Si-HF system based on a quantitative analysis of current transients

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1998

Year

Jürgen Carstensen, Ruben D. Prange, G Popkirov, H. Föll

Applied Physics A

Device ModelingElectrical EngineeringEngineeringHigh-frequency DeviceCurrent OscillationsBias Temperature InstabilityQuantitative AnalysisCurrent TransientsPower ElectronicsMicroelectronicsCircuit AnalysisCircuit Simulation

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