An x-ray spectrometer for Compton scattering

Abstract

An x-ray spectrometer has been designed and constructed for Compton scattering measurements using 40–70 keV x-rays from an ellipsoid multipole wiggler (EMPW) installed in the accumulation ring of the National Laboratory for High Energy Physics at Tsukuba. The spectrometer has four sets of a Cauchois-type energy analyzer and an imaging plate, which are arranged on the surface of a cone and share a scattering angle of 160°. In each energy-analyzing system, to increase signal to noise ratio a set of vertical and horizontal slits are inserted between the analyzer and the imaging plate. A resolution of 0.13 a.u. in terms of electron momentum was achieved. A Compton profile of a vanadium single crystal was measured with an integrated counting rate of 400 counts/s.