Automatic defect recognition of TFT array process using gray level co-occurrence matrix - Concepedia

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Automatic defect recognition of TFT array process using gray level co-occurrence matrix

40

Citations

14

References

2014

Year

Shih‐Wei Yang, Chern‐Sheng Lin, Shir‐Kuan Lin, Hsien-Te Chiang

EngineeringPattern RecognitionAutomatic Defect RecognitionComputer EngineeringSystems EngineeringTft Array ProcessFault DetectionSignal ProcessingAutomated Inspection

References

	Year	Citations

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