Journal of the Optical Society of America · 1960 · 48 citations · 1 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsOptical MaterialsThin FilmsOptical Properties Of SolidsOptical Thin FilmsReflectance ModelingThin Film Electrical PropertiesThin Film Optical PropertiesThin-film MaterialsLight-absorbing LayersOptical ConstantsOptical ReflectanceOptical Thin Film CharacterizationOptical TransmittanceReflectance CalculationThickness-dependent Optical PropertiesThin-film Optical Characterization
A general program for the IBM 650 is presented for calculating the reflectance and transmittance of arbitrary multilayer combinations of absorbing and nonabsorbing films as functions of wavelength and angle of incidence. The basic formulas which are utilized in the calculations are given together with the essential details of the machine program, including a macro-flow diagram.
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Computations in thin film optics
W. Weinstein · Vacuum · 1954 · 68 citations