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Photoionization of 4d-electrons in singly charged Xe ions
38
Citations
15
References
1996
Year
Yield SpectrumEngineeringAtomic Emission SpectroscopyChemistryElectronic Excited StatePhoton EnergyElectron SpectroscopyIon EmissionEv Photon EnergyPhysicsPhotochemistryAtomic PhysicsQuantum ChemistryExcited State PropertyXe IonsNatural SciencesSpectroscopyApplied PhysicsIon Structure
Using a photon - ion merged-beam technique, we measured the relative yield spectra of and ions created by photoionization of ions as a function of the photon energy in the 4d ionization region. The ion production, i.e. the double-electron ionization process is found to be dominant throughout the energy range investigated. A broad structure of 4d excitation ionization around 100 eV photon energy was observed in the yield spectrum. A spectral shoulder was observed for at around 85 eV, which was absent in the photoionization of neutral Xe. Some discrete lines were observed for both the - and -yield spectra below 75 eV. The experimental spectra were analysed by a multiconfiguration Dirac - Fock calculation. The largest structure at around 100 eV is attributable to (n=6,7) two-electron transitions. The discrete lines were found to be due to , n f transitions. A serious 4f-orbital collapse is suspected in the 4 fn p two-electron excited states, whereas the collapse is moderate in the singly excited 4f-orbitals.
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