Nano-scale mapping of lattice strain and orientation inside carbon core SiC fibres by synchrotron X-ray diffraction - Concepedia

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Nano-scale mapping of lattice strain and orientation inside carbon core SiC fibres by synchrotron X-ray diffraction

20

Citations

20

References

2014

Year

Nikolaos Baimpas, Alexander J.G. Lunt, Igor P. Dolbnya, Jiří Dluhoš, Alexander M. Korsunsky

Materials ScienceNano-scale MappingEngineeringSynchrotron X-ray DiffractionLattice StrainCeramic MaterialApplied PhysicsStructural CeramicCarbideCeramic Matrix Composite

References

	Year	Citations

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