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The maximum-entropy method in charge-density studies. II. General aspects of reliability
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1994
Year
EngineeringReliability EngineeringIntrinsic BiasSmoothing SchemeGeneral AspectsThermodynamicsReliability AnalysisApproximation TheoryReliabilityElectrical EngineeringHardware ReliabilityPhysicsMaximum-entropy MethodDevice ReliabilityPhysic Of FailureMaximum-entropy MapsEntropyCircuit ReliabilityCharge-density StudiesElectrical Insulation
Several general properties of maximum-entropy maps are reviewed that substantiate previous results from selected applications. In particular, the maximum-entropy method (MEM) is depicted as a smoothing scheme and the intrinsic bias introduced by this procedure is pointed out. It is argued that the MEM is not well suited for accurate charge-density mapping.