Single-element elliptical hard x-ray micro-optics

K. Evans‐Lutterodt, J. M. Ablett, Aaron Stein, C.-C. Kao, D. M. Tennant, F. Klemens, Ashley Taylor, Chris Jacobsen, P. L. Gammel, H. A. Huggins,

Optics Express · 2003 · 97 citations · 2 references

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Abstract

Using micro-fabrication techniques, we have manufactured a single element kinoform lens in single-crystal silicon with an elliptical profile for 12.398 keV (1A) x-rays. By fabricating a lens that is optimized at fixed wavelengths, absorption in the lens material can be significantly reduced by removing 2_ phase-shifting regions. This permits short focal length devices to be fabricated with small radii of curvatures at the lens apex. This feature allows one to obtain a high demagnification of a finite synchrotron electron source size. The reduced absorption loss also enables optics with a larger aperture, and hence improved resolution for focusing and imaging applications. Our first trial of these lenses has resulted in a one micron line focus (fwhm) at the National Synchrotron Light Source X13B beamline.

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