The role of electron spectroscopy in the evolution of long‐range industrial R&D illustrated by AES studies in adhesion, catalysis and corrosion

W.J. van Ooij, T.H. Visser, M. E. F. Biemond

Surface and Interface Analysis · 1984 · 20 citations · 18 references

Concepts

Abstract

Abstract The improvement in spatial resolution of scanning Auger spectroscopy in recent years has increased its applicability to industrial problems markedly, as is illustrated by several case studies in adhesion, corrosion and related areas. It is shown that the analytical capabilities of AES are enhanced if complemented by simultaneous energy‐dispersive x‐ray analysis. Suggestions for further development of AES instruments for use in industrial R&D are given.

References

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