Concepedia

An autofocus method for a TEM

Abraham J. Koster, A. van den Bos, K.D. van der Mast

Ultramicroscopy · 1987 · 88 citations · 7 references

DOI

Concepts

References

7

Spectral Analysis and Time Series

David B. Preston · Technometrics · 1983 · 4.9K citations

, , +14

The fourier integral and its applications

Journal of the Franklin Institute · 1962 · 466 citations

, , +9

Coma-free alignment of high resolution electron microscopes with the aid of optical diffractograms

F. Zemlin, P. Schiske, W. Kunath et al. · Ultramicroscopy · 1978 · 268 citations

, , +6

An automatic focusing and astigmatism correction system for the SEM and CTEM

S. Erasmus, K.C. Smith · Journal of Microscopy · 1982 · 132 citations

, , +16

Procedures for focusing, stigmating and alignment in high resolution electron microscopy

W. O. Saxton, David J. Smith, S. Erasmus · Journal of Microscopy · 1983 · 75 citations

, , +13