Publication | Closed Access

Instability of threshold voltage under constant bias stress in pentacene thin film transistors employing polyvinylphenol gate dielectric

Polyvinylphenol Gate DielectricElectrical EngineeringEngineeringSemiconducting PolymerOrganic ElectronicsStress-induced Leakage CurrentApplied PhysicsThreshold VoltageOrganic SemiconductorMicroelectronicsConstant Bias StressElectrical Insulation