An Improved Dipole-Moment Model Based on Near-Field Scanning for Characterizing Near-Field Coupling and Far-Field Radiation From an IC

TLDR

The study proposes an improved dipole‑moment model that uses near‑field scanning to characterize both near‑field coupling and far‑field radiation from an integrated circuit. The model reconstructs electric and magnetic dipole moments from scanning data using regularization, truncated singular‑value decomposition, and least‑squares techniques, then employs these moments as noise sources to reproduce field distributions above the IC. A simple example demonstrates the method’s effectiveness, showing it is especially valuable for accurately analyzing radio‑frequency interference caused by near‑field noise coupling.

Abstract

In this paper, an improved dipole-moment model for characterizing near-field coupling and far-field radiation from an IC based on near-field scanning is proposed. An array of electric and magnetic dipole moments is used to reproduce the field distributions in a scanning plane above an IC. These dipole moments can then be used as noise sources for the IC. In order to ensure the accurate prediction of the near-field coupling from the IC, the regularization technique and the truncated singular-value decomposition method are investigated in this paper, together with the conventional least-squares method, to reconstruct the dipole moments from the near-field scanning data. A simple example is used to demonstrate the approach. The improved dipole-moment model is particularly useful for addressing radio-frequency interference issues where near-field noise coupling needs to be accurately analyzed.