Publication | Closed Access
Analysis of leakage currents in MOCVD grown GaInAsSb based photodetectors operating at 2 µm
21
Citations
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References
2006
Year
Wide-bandgap SemiconductorSemiconductor TechnologyElectrical EngineeringEngineeringApplied PhysicsPhotoelectric MeasurementOptoelectronicsLeakage CurrentsCompound SemiconductorSemiconductor Device
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