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A study of the initial oxidation of polycrystalline Si using surface analysis techniques
16
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1981
Year
EngineeringOxidation ResistancePolycrystalline SiMaterial InnovationSilicon On InsulatorSurface Analysis TechniquesCorrosionMaterials ScienceMaterial PropertySemiconductor Device FabricationMicrostructureSilicon DebuggingInitial OxidationMaterial AnalysisSurface AnalysisSurface ScienceApplied PhysicsMaterials CharacterizationVacuum Science
Views Icon Views Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Icon Share Twitter Facebook Reddit LinkedIn Tools Icon Tools Reprints and Permissions Cite Icon Cite Search Site Citation L. L. Kazmerski, O. Jamjoum, P. J. Ireland, R. L. Whitney; A study of the initial oxidation of polycrystalline Si using surface analysis techniques. J. Vac. Sci. Technol. 1 April 1981; 18 (3): 960–964. https://doi.org/10.1116/1.570964 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAVS: Science & Technology of Materials Interfaces and ProcessingJournal of Vacuum Science and Technology Search Advanced Search |Citation Search