Concepedia

Characterization of the microstructure in random and textured polycrystals and single crystals by diffraction line profile analysis

Gábor Ribárik, T. Ungár

Materials Science and Engineering A · 2010 · 188 citations · 45 references

DOI

Concepts

References

45

The Rietveld method

R. A. Young · 1993 · 2.6K citations

, , +15

The Effect of Cold-Work Distortion on X-Ray Patterns

Β. E. Warren, B. L. Averbach · Journal of Applied Physics · 1950 · 1.4K citations

, , +16

The effect of dislocation contrast on x-ray line broadening: A new approach to line profile analysis

T. Ungár, A. Borbély · Applied Physics Letters · 1996 · 1.3K citations

, , +17

The contrast factors of dislocations in cubic crystals: the dislocation model of strain anisotropy in practice

T. Ungár, I. C. Dragomir, Ádám Révész et al. · Journal of Applied Crystallography · 1999 · 1.2K citations

, , +17

Choice of collimators for a crystal spectrometer for neutron diffraction

G. Caglioti, A. Paoletti · Nuclear Instruments · 1958 · 1.1K citations

, , +9