The combined use of He back-scattering and He-induced X-rays in the study of anodically grown oxide films on GaAs - Concepedia

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The combined use of He back-scattering and He-induced X-rays in the study of anodically grown oxide films on GaAs

56

Citations

3

References

1973

Year

L. C. Feldman, J.M. Poate, F. Ermanis, B. Schwartz

Thin Solid Films

Materials ScienceHe-induced X-raysX-ray SpectroscopyEngineeringPhysicsOxide ElectronicsX-ray DiffractionApplied PhysicsGallium OxideOptoelectronicsCompound Semiconductor

References

	Year	Citations

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