Subsurface flaw detection in metals by photoacoustic microscopya

Abstract

The scanning photoacoustic microscope (SPAM) is used in both the conventional and phase-contrast modes to detect a well-characterized subsurface flaw in Al. The physical mechanism is that of thermal diffusion, with a subsurface probe depth and flaw resolution length of approximately one thermal-diffusion length. Comparison of the dependences of the photoacoustic signal upon chopping frequency from the different regions of the sample confirm that the differential signal from the flaw corresponds to a transition from thermally thick to thermally thin boundary conditions. Experimental results are in good agreement with calculations based upon a three-dimensional thermal-diffusion model.