Photoreflectance study of strained (001) Si1−xGex/Si layers - Concepedia

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Photoreflectance study of strained (001) Si1−xGex/Si layers

20

Citations

8

References

1992

Year

Yichun Yin, Fred H. Pollak, P Auvray, D. Dutartre, R. Pantel, J. A. Chroboczek

Thin Solid Films

Applied PhysicsSilicon On InsulatorPhotoreflectance Study

References

	Year	Citations

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