Applied Physics Letters · 2007 · 141 citations · 21 references
EngineeringMaterials EngineeringMaterials ScienceOptoelectronicsPhotonicsSemiconductor DevicesOptical SourcesOxide SemiconductorsSemiconductor LasersSilicon MaterialsThin Film Optical PropertiesElectroluminescenceForward Bias CharacteristicsPolycrystalline Semiconductor FilmsPolycrystalline SiliconPolycrystalline Thin FilmsScatteringSiliconSpontaneous Emission
The electrically pumped ultraviolet (UV) random lasing in c-axis oriented ZnO polycrystalline films has been demonstrated. For this demonstration, a metal-oxide-semiconductor structure of Au∕SiOx(x<2)∕ZnO film was fabricated on a silicon substrate. With ever-higher forward bias where the negative voltage was connected to the silicon substrate, the UV electroluminescence from such a ZnO-based device transformed from the spontaneous emission to the random lasing in the ZnO film. It is believed that the recurrent scattering and interference of the enough strong electroluminescent UV light in the in-plane random cavities formed in the ZnO film leads to electrically pumped UV random lasing.
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Random Laser Action in Semiconductor Powder
Hui Cao, Yuxia Zhao, Seng Tiong Ho et al. · Physical Review Letters · 1999 · 1.7K citations
Hui Cao · Waves in Random Media · 2003 · 566 citations
Natural Sciences, Physics, Optics +15
TOPICAL REVIEW: Lasing in random media
Hui Cao · Waves in Random Media · 2003 · 354 citations