Applied Physics Letters · 2010 · 292 citations · 12 references
Natural SciencesElectrical EngineeringMaterials ScienceElectronic MaterialsMaterials PhysicsMicroelectronicsElectrical CharacterizationElectrical ConductivityElectronic Transport ModelingGraphene NanomaterialsSemiconductor Device MaterialsThin Film Electrical PropertiesConductionContact ResistanceCurrent Path AnalysisElectrical Resistance MeasurementGraphene Field-effect TransistorsMetal-metal ContactsResistivityResistivity Measurement
The contact properties between metal and graphene were examined. The electrical measurement on a multiprobe device with different contact areas revealed that the current flow preferentially entered graphene at the edge of the contact metal. The analysis using the cross-bridge Kelvin (CBK) structure suggested that a transition from the edge conduction to area conduction occurred for a contact length shorter than the transfer length of ∼1 μm. The contact resistivity for Ni was measured as ∼5×10−6 Ω cm2 using the CBK. A simple calculation suggests that a contact resistivity less than 10−9 Ω cm2 is required for miniaturized graphene field effect transistors.
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