Measurements of X-Ray Anomalous Scattering Factors near the Cu K Absorption Edge by the Use of Synchrotron Radiation

Abstract

By the use of monochromatized X-rays from synchrotron radiation at Stanford Synchrotron Radiation Laboratory (SSRL), the reflectivity of Cu has been measured to determine the anomalous scattering factors f'(ω) and f''(ω) very near the K absorption edge. The results for f'(ω) and f''(ω) are compared with calculated values by the Hönl's theory, measured values of f''(ω) from the absorption coefficient µ(ω) and calculated values of f'(ω) from µ(ω) through the dispersion relation.