Surface photoabsorption studies of the chemical structure of GaInP grown by organometallic vapor phase epitaxy

Hideyuki Murata, I. H. Ho, T. C. Hsu, G. B. Stringfellow

Applied Physics Letters · 1995 · 38 citations · 0 references

Concepts

Abstract

The surface structure of Ga0.52In0.48P was studied by surface photoabsorption. An absorption peak due to P dimers on Ga0.52In0.48P was observed at ∼400 nm, shorter than for InP (430 nm). From comparison with results for GaAs and InP, the data are interpreted to indicate that at a tertiarybutylphosphine (TBP) pressure of 50 Pa for temperatures below 670 °C, the P-stabilized surface has P dimers aligned along the [1̄10] direction, i.e., it has a (2×4)-like structure. Above 670 °C, the 400 nm peak due to the P-dimer structure disappears because of P desorption from the surface at this TBP partial pressure. Epitaxial Ga0.52In0.48P layers grown using TBP, trimethylgallium and ethyldimethylindium are nearly disordered at 670 °C and highly ordered at 620 °C. These data suggest a correlation between surface structure and ordering.