Publication | Closed Access
Beam-Lead Technology
161
Citations
1
References
1966
Year
Materials ScienceMaterials EngineeringElectrical EngineeringEngineeringAdvanced Packaging (Semiconductors)CorrosionMaterials FabricationApplied PhysicsGold BeamSemiconductor Device FabricationIntegrated CircuitsBatch-fabricate Beam-lead TransistorsMicroelectronicsTest TransistorsStructural Materials
A process has been developed to batch-fabricate beam-lead transistors, integrated circuits, and other components, where the leads serve a structural and protective as well as electrical function. Platinum silicide ohmic contacts, titanium and platinum sputtered layers, and electroformed gold beam leads constitute the metallurgical structure of the devices described. Test transistors have survived 350°C aging for hundreds of hours in corrosive ambients, and centrifuging at 135,000 g's.
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