Bell System Technical Journal · 1966 · 161 citations · 1 references
EngineeringElectrical EngineeringMaterials EngineeringMetallurgyMicroelectronicsSemiconductor DevicesCorrosion EngineeringCorrosion-resistant MaterialsHigh-temperature CorrosionMetal FabricationMetal-semiconductor ContactsMetalsMetallurgical BondingMetallurgical ChangeOhmic ContactsSilicide Contacts
A process has been developed to batch-fabricate beam-lead transistors, integrated circuits, and other components, where the leads serve a structural and protective as well as electrical function. Platinum silicide ohmic contacts, titanium and platinum sputtered layers, and electroformed gold beam leads constitute the metallurgical structure of the devices described. Test transistors have survived 350°C aging for hundreds of hours in corrosive ambients, and centrifuging at 135,000 g's.
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Max Hansen, K. Anderko, H. W. Salzberg · Journal of The Electrochemical Society · 1958 · 14.8K citations