Journal of Applied Physics · 1967 · 107 citations · 6 references
EngineeringMaterials EngineeringMaterials ScienceCondensed Matter PhysicsElectronic MaterialsSemiconductor MaterialsCompound SemiconductorsSemiconductor Device MaterialsSemiconductor PhysicsThermal Expansion AnalysisThermal Properties Of SemiconductorsWide-bandgap SemiconductorsDiffraction PatternsEnergy Band GapHigh-temperature Thermal PropertiesNarrow-bandgap SemiconductorsPowder DiffractionPowder Diffraction AnalysisPowder X-ray DiffractionSemiconductor Band Gap Determination
Precise cell dimensions of GaAs, GaAs0.59P0.41, GaAs0.5P0.5, and GaP have been determined from x-ray powder diffraction patterns from −62° to 200°C. Within the temperature range investigated, the constant thermal coefficients of expansion are, respectively, 6.86×10−6, 7.81×10−6, 5.91×10−6, and 5.81×10−6°C−1. The cell dimension of pure GaP (impurity less than 3.0 ppm) is 5.4495±0.0001 Å at 24°C.
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Bimolecular Electroluminescent Transitions in GaP
E. E. Loebner, E. W. Poor · Physical Review Letters · 1959 · 36 citations