Publication | Closed Access

Modeling of small size MOSFETs with reverse short channel and narrow width effects for circuit simulation

Device ModelingElectrical EngineeringEngineeringCircuit DesignBias Temperature InstabilityNarrow Width EffectsComputer EngineeringModeling And SimulationSmall Size MosfetsPower ElectronicsMicroelectronicsCircuit AnalysisReverse Short ChannelCircuit Simulation