The preparation of transmission electron microscope specimens from compound semiconductors by ion milling - Concepedia

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The preparation of transmission electron microscope specimens from compound semiconductors by ion milling

130

Citations

18

References

1987

Year

N. G. Chew, A. G. Cullis

Ultramicroscopy

SemiconductorsMaterials ScienceEngineeringElectron MicroscopyMicroscopyIon MillingScanning Probe MicroscopyCompound SemiconductorsApplied PhysicsMicroanalysisElectron MicroscopeMicroscope SpecimensMicroelectronicsElectron Optic

References

	Year	Citations

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