Direct Determination of X-Ray Reflection Phases

Abstract

A practical method is described for the phase determination of x-ray reflections from single crystals. Considerations on the dynamical interaction in multiple diffraction and on the relative rotation of the crystal lattice with respect to the Ewald sphere reveal both experimentally and theoretically the phase dependence of the reflected intensity. Applications can be made for a direct experimental determination of phases without carrying out the complicated dynamical calculation.