Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1987 · 65 citations · 0 references
ComputingComputer ScienceManufacturing EngineeringAutomationComputer VisionMachine VisionFeature DetectionImage Feature EngineeringImage ProcessingIndustrial InspectionPattern RecognitionComputer Vision For InspectionCorrelationDegradationFeature Recognition For ManufacturingImage AlignmentLocal Feature DetectionNormalized Cross-correlation
This paper is an in-depth look at determining the location and quality of image features by normalized correlation. We have investigated its accuracy, repeatability, and susceptibility to various forms of image degradation, and compared the results to other methods of locating features. We also present a novel, inexpensive device that performs the necessary computations very efficiently. The emphasis is on locating features for current, practical applications in manufacturing automation.