Normalized Correlation Search In Alignment, Gauging, And Inspection

William M. Silver

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1987 · 65 citations · 0 references

Concepts

Abstract

This paper is an in-depth look at determining the location and quality of image features by normalized correlation. We have investigated its accuracy, repeatability, and susceptibility to various forms of image degradation, and compared the results to other methods of locating features. We also present a novel, inexpensive device that performs the necessary computations very efficiently. The emphasis is on locating features for current, practical applications in manufacturing automation.