Pre-stack migration and true-amplitude processing of DEKORP near-normal incidence and wide-angle reflection measurements - Concepedia

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Pre-stack migration and true-amplitude processing of DEKORP near-normal incidence and wide-angle reflection measurements

36

Citations

2

References

1996

Year

M. Simon, H. Gebrande, M. Bopp

EngineeringPhysicsMeasurementOptical PropertiesSpectroscopyCalibrationApplied PhysicsInterferometryPre-stack MigrationDekorp Near-normal IncidenceNatural SciencesOptic DesignTrue-amplitude ProcessingOptical TestingSeismic Reflection ProfilingInstrumentationOptical System Analysis

References

	Year	Citations

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