Analytical Chemistry · 2010 · 35 citations · 22 references
EngineeringChemical EngineeringChemistryAnalytical ChemistryInterface ScienceSensorsCarbon NanotubesChemical SensorsElectrochemical SensorsNanosensorsNanotubesSensor MaterialsAromatic HydrocarbonsCarbon Nanotube SensorsDouble-layer CapacitancePotentiometric DetectionPotentiometric MeasurementPotentiometric SensorsSensingSingle-walled Carbon Nanotubes
Surfaces made of entangled networks of single-walled carbon nanotubes (SWCNTs) display a strong adsorption affinity for aromatic hydrocarbons. Adsorption of these compounds onto the walls of SWCNTs changes the electrical characteristics of the SWCNT-solution interface. Using these features, we have developed a potentiometric sensor to detect neutral aromatic species. Specifically, we can detect online aromatic hydrocarbons in industrial coolant water. Our chromatographic results confirm the adsorption of toluene onto the walls of carbon nanotubes, and our impedance spectroscopy data show the change in the double layer capacitance of the carbon nanotube-solution interface upon addition of toluene, thus confirming the proposed sensing mechanism. The sensor showed a toluene concentration dependent EMF response that follows the shape of an adsorption isotherm and displayed an immediate response to the presence of toluene with a detection limit of 2.1 ppm. The sensor does not respond to other nonaromatic hydrocarbons that may coexist with aromatic hydrocarbons in water. It shows a qualitative sensitivity and selectivity of 100% and 83%, respectively, which confirms its ability to detect aromatic hydrocarbons in aqueous solutions. The sensor showed an excellent ability to immediately detect the presence of toluene in actual coolant water. Its operational characteristics, including its fast response, low cost, portability, and easy use in online industrial applications, improve those of current chromatographic or spectroscopic techniques.
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Supercapacitors Using Single-Walled Carbon Nanotube Electrodes
Kay-Hyeok An, W. S. Kim, Y. S. Park et al. · Advanced Materials · 2001 · 649 citations