The importance of beam alignment and crystal tilt in high resolution electron microscopy - Concepedia

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The importance of beam alignment and crystal tilt in high resolution electron microscopy

167

Citations

18

References

1983

Year

David J. Smith, W. O. Saxton, M. A. O’Keefe, George Wood, W. M. Stobbs

Ultramicroscopy

EngineeringElectron MicroscopyPhysicsMicroscopyBeam AlignmentMicroscopy MethodApplied PhysicsDiffractionElectron DiffractionElectron MicroscopeCrystallographyCrystal TiltElectron Optic

References

	Year	Citations

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