An Improved Type of Electron Temperature Probe

Abstract

It has already been reported by one of the authors that electron temperature can be calculated from the ratio of the two floating potential shifts caused by the rf signals of different amplitude which is successively applied to the Langmuir probe. However, conventional type of electron temperature probe which is based on the above principle detects v×B voltage induced by geomagnetic field and rocket velocity as well as any other noise.In order to get rid of the effects of v×B and random noise, an improved type of electron temperature probe is developed with sufficient results. At the same time, the instrument is made compact and light-weighted to some extent.