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In situ spectrochemical analysis of solid surfaces by ion beam sputtering
66
Citations
10
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1977
Year
EngineeringDatabasesAltmetric Attention ScoreBibliometricsIon Beam SputteringChemistrySolid SurfacesAltmetricsInformationQuantitative AnalysisAnalytical ChemistryBiostatisticsIon BeamCitation AnalysisIon Beam SputteringnIon EmissionMaterials ScienceChemometricsSurface CharacterizationDonut IconNatural SciencesSpectroscopySurface ScienceMass SpectrometrySurface AnalysisSitu Spectrochemical Analysis
ADVERTISEMENT RETURN TO ISSUEPREVArticleNEXTIn situ spectrochemical analysis of solid surfaces by ion beam sputteringN. H. Tolk, I. S. T. Tsong, and C. W. WhiteCite this: Anal. Chem. 1977, 49, 1, 16A–30APublication Date (Print):January 1, 1977Publication History Published online21 September 2008Published inissue 1 January 1977https://doi.org/10.1021/ac50009a001RIGHTS & PERMISSIONSArticle Views60Altmetric-Citations59LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InReddit PDF (2 MB) Get e-Alerts Get e-Alerts
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