Optics Letters · 1998 · 79 citations · 4 references
Natural SciencesMaterials EngineeringMaterials ScienceOptical MaterialsOpticsPhotonicsCoatingsOptical Thin FilmsSemiconductor SurfacesSilicon MaterialsSurface CoatingsThin Film Optical PropertiesHigh-reflectance MaterialsHigh-reflectivity CoatingsMaterial ReflectivityNormal Incidence ReflectionOptical CoatingsX-ray MirrorsX-ray Reflectivity
Sc-Si multilayers are suggested as high-reflectivity coatings for a VUV interval of 35-50 nm. Fabricated mirrors show normal-incidence reflectivity of 30-54%, which is high enough for effective manipulation of the beams of compact-discharge, laser-driven x-ray lasers. The values obtained are not, however, limits for Sc-Si coatings. Theoretical estimations as well as electron microscopy studies of Sc-Si interfaces indicate a large potential for a further increase in their reflectivity.
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Soft-x-ray interferometer for single-shot laser linewidth measurements
J. L. A. Chilla, Oscar E. Martínez, Mario C. Marconi et al. · Optics Letters · 1996 · 17 citations · Full text