Journal of the American Chemical Society · 2010 · 301 citations · 33 references
Natural SciencesMaterials EngineeringMaterials ScienceNanomaterialsNanotechnologySemiconductor MaterialsNanoenergy MaterialsNanostructured Energy MaterialsNanowiresPiezoelectric MaterialsSemiconductor Device MaterialsSemiconductor NanomaterialsConductive Atomic Force MicroscopyGallium Nitride (Gan) MaterialsNanogeneratorsNanowire ArraysNoncontact Atomic Force MicroscopyPiezoelectric Energy HarvestingPiezoelectric Nanowires
Three-fold symmetrically distributed GaN nanowire (NW) arrays have been epitaxially grown on GaN/sapphire substrates. The GaN NW possesses a triangular cross section enclosed by (0001), (2112), and (2112) planes, and the angle between the GaN NW and the substrate surface is approximately 62 degrees . The GaN NW arrays produce negative output voltage pulses when scanned by a conductive atomic force microscope in contact mode. The average of piezoelectric output voltage was about -20 mV, while 5-10% of the NWs had piezoelectric output voltages exceeding -(0.15-0.35) V. The GaN NW arrays are highly stable and highly tolerate to moisture in the atmosphere. The GaN NW arrays demonstrate an outstanding potential to be utilized for piezoelectric energy generation with a performance probably better than that of ZnO NWs.
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