Publication | Closed Access
The failure analyses on ZnO varistors used in high tension devices
28
Citations
19
References
2005
Year
Electrical EngineeringEngineeringNanoelectronicsBias Temperature InstabilityMechanical EngineeringHigh Tension DevicesEngineering Failure AnalysisCircuit ReliabilityDevice ReliabilityMicroelectronicsZno VaristorsPhysic Of Failure
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