Publication | Closed Access
Waveguide study and refractive indices of GaN:Mg epitaxial film
19
Citations
10
References
1996
Year
Materials ScienceEpitaxial GrowthEngineeringPhysicsOptical PropertiesApplied PhysicsWaveguide StudyAluminum Gallium NitrideGan Power DeviceTe Mode MeasurementsGuided-wave OpticWaveguide TeTm ModesCategoryiii-v SemiconductorOptoelectronics
Waveguide TE and TM modes in a GaN:Mg epitaxial crystalline film were studied in a wide spectral range (457.9-1053 nm). The refractive indices n(e) and n(o) were accurately determined by TM and TE mode measurements at six different wavelengths (457.9, 514.5, 632.8, 724.3, 855.1, and 1053 nm). Dispersive curves of n(e) versus lambda and no versus lambda were obtained. It was found that bireferingence slightly increases (n(e) - n(o) = 0.033-0.038) from 1053 to 457.9 nm.
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