Fractal characterization of the silicon surfaces produced by ion beam irradiation of varying fluences - Concepedia

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Fractal characterization of the silicon surfaces produced by ion beam irradiation of varying fluences

50

Citations

39

References

2015

Year

Ram Pratap Yadav, Tanuj Kumar, Ashok Mittal, Suneet Dwivedi, D. Kanjilal

Applied Surface Science

Materials ScienceIon ImplantationEngineeringCrystalline DefectsMicrofabricationOptical PropertiesPhysicsSurface ScienceApplied PhysicsFractal CharacterizationIon Beam IrradiationIon BeamSilicon SurfacesIon EmissionMicroelectronicsSilicon On Insulator

References

	Year	Citations

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