Applied Physics Letters · 2009 · 72 citations · 12 references
Natural SciencesMaterials EngineeringMaterials ScienceMaterials CharacterizationOptical MaterialsThin FilmsOptical Properties Of MaterialsOptical Properties Of SolidsOptical Thin FilmsRefractive IndexThin Film Optical PropertiesThin-film MaterialsBirefringenceDichroismInterband TransitionsOptical CharacterizationOptical ConstantsOptical Thin Film CharacterizationSpectroscopic EllipsometryThin-film Optical Characterization
Generalized spectroscopic ellipsometry determines the principal monoclinic optical constants of thin films consisting of slanted titanium nanocolumns deposited by glancing angle deposition under 85° incidence and tilted from the surface normal by 47°. Form birefringence measured for wavelengths from 500 to 1000 nm renders the Ti nanocolumns monoclinic absorbing crystals with c-axis along the nanocolumns, b-axis parallel to the film interface, and 67.5° monoclinic angle between the a- and c-axes. The columnar thin film reveals anomalous optical dispersion, extreme birefringence, strong dichroism, and differs completely from bulk titanium. Characteristic bulk interband transitions are absent in the spectral range investigated.
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Optical properties of thin films
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Generalized ellipsometry and complex optical systems
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