Heterogeneous flow and brittle failure in shock-compressed silicon

Abstract

We combine a recently developed high-resolution two-dimensional (2D) imaging velocimetry technique (velocity interferometer system for any reflector (VISAR)) with 1D VISAR measurements to construct a moving picture of heterogeneous deformation in shock-compressed single crystal silicon. The 2D VISAR takes an intensity snapshot of target velocity and reflectivity over a mm field-of-view while the compression history is simultaneously recorded by the 1D VISAR. Our data show particle velocity surface roughening due to the anisotropic onset of plasticity and, above ∼13 GPa, a structural phase transformation. Shock arrival at the Si free-surface is characterized by the formation of fracture networks and incipient velocity jetting.