Low-loss rib waveguides containing Si nanocrystals embedded in SiO2

Abstract

We report on the study and modeling of the structural and optical properties of rib-loaded waveguides working in the 600–900-nm spectral range. A Si nanocrystal (Si-nc) rich SiO2 layer with nominal Si excess ranging from 10% to 20% was produced by quadrupole ion implantation of Si into thermal SiO2 formed on a silicon substrate. Si-ncs were precipitated by annealing at 1100°C, forming a 0.4-μm-thick core layer in the waveguide. The Si content, the Si-nc density and size, the Si-nc emission, and the active layer effective refractive index were determined by dedicated experiments using x-ray photoelectron spectroscopy, Raman spectroscopy, energy-filtered transmission electron microscopy, photoluminescence and m-lines spectroscopy. Rib-loaded waveguides were fabricated by photolithographic and reactive ion etching processes, with patterned rib widths ranging from 1to8μm. Light propagation in the waveguide was observed and losses of 11dB∕cm at 633 and 780nm were measured, modeled and interpreted.