Publication | Closed Access
Study of contact resistivity, mechanical integrity, and thermal stability of Ti/Al and Ta/Al ohmic contacts to n-type GaN
34
Citations
11
References
1998
Year
Materials ScienceAluminium NitrideElectrical EngineeringWide-bandgap SemiconductorEngineeringApplied PhysicsAluminum Gallium NitrideGan Power DeviceMechanical IntegrityN-type GanMicroelectronicsThermal Stability
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