Polarization effects in thallium bromide x-ray detectors

Abstract

We present the results of a detailed experimental study of polarization effects in thallium bromide planar x-ray detectors. Measurements were carried out in the range 10–100 keV by scanning a highly focused x-ray beam, 50 μm in diameter, from a synchrotron source across the detector. Above a certain radiation threshold the detector response showed a systematic degradation of its spectroscopic characteristics, peak channel position, peak height, and energy resolution. Using a pump-and-probe technique, we studied the dynamics of spectral degradation, the spatial extent and relaxation of the polarized region, and the dependence of the detector response on bias voltage and temperature. For comparison, we modeled polarization effects induced by the charging of traps by both electrons and holes using a model based on recent theoretical work of Bale and Szeles. We calculated the charge collection efficiency and spectral line shapes as functions of exposure time, beam position, count rate, and photon energy, and obtained credible agreement with experimental results.