Applied Physics Letters · 1995 · 228 citations · 0 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsSurface ScienceThin FilmsAtomic Force MicroscopyDielectric PropertiesDielectricsIntermolecular ForcesScanning Probe MicroscopySurface PhysicsAtomic Force Microscopy Surface AnalysisDielectric PolarizabilityDielectric PolarizationPolarization MicroscopySurface PolarityThin Liquid FilmsTip - Sample InteractionsTip-sample Interactions
The atomic force microscope is used to measure dielectric polarization forces on surfaces induced by a charged tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using polarization forces we have been able to image liquid films, droplets, and other weakly adsorbed material.