Characterization of microstructures in Inconel 625 using X-ray diffraction peak broadening and lattice parameter measurements

A profile refinement method for nuclear and magnetic structures

H. M. Rietveld · Journal of Applied Crystallography · 1969 · 17.2K citations

Natural Sciences, Physics, Crystal Structure +9

X-ray line broadening from filed aluminium and wolfram

G.K. Williamson, W H Hall · Acta Metallurgica · 1953 · 10.2K citations

Natural Sciences, Materials Science, Spectroscopy +5

The Rietveld method

R. A. Young · 1993 · 2.6K citations

Natural Sciences, Materials Engineering, Materials Science +15

Microstructure and mechanical properties of Inconel 625 superalloy

Vani Shankar, K. Bhanu Sankara Rao, S.L. Mannan · Journal of Nuclear Materials · 2001 · 556 citations

Natural Sciences, Materials Engineering, Materials Science +13

A profile-fitting procedure for analysis of broadened X-ray diffraction peaks. I. Methodology

Stefano Enzo, G. Fagherazzi, A. Benedetti et al. · Journal of Applied Crystallography · 1988 · 289 citations

Natural Sciences, Materials Engineering, Materials Science +16