Publication | Closed Access
Characterisation of interfacial properties in sputtered Co/Cu multilayers: X-ray reflectometry compared with TEM and AFM
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Citations
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References
1999
Year
Materials ScienceSurface CharacterizationMaterial AnalysisEngineeringSurface AnalysisSurface ScienceApplied PhysicsSputtered Co/cu MultilayersX-ray ReflectometryThin FilmsInterfacial PropertiesDepth-graded Multilayer CoatingMicrostructure
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