Journal of Applied Physics · 2008 · 108 citations · 27 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsElectronic MaterialsSemiconductor MaterialsNanostructured Electronic MaterialsQuantum DotsSemiconductor HeterostructuresSemiconductor InterfacesSemiconductor NanomaterialsSemiconductor PhysicsQuantum Dot MaterialsSemiconductor Quantum Dots
Using plan-view and cross-sectional scanning tunneling microscopy, the shape and composition of InAs/GaAs quantum dots are investigated before and after capping by GaAs. During capping, the original pyramidally shaped quantum dots become truncated, resulting in a flat (001) top facet and steeper side facets. The InAs quantum dots are found to be intermixed at their top with GaAs due to material rearrangement. Since the bottom interface of quantum dots and wetting layer is always sharp, this intermixing occurs during capping and not during quantum dot growth. Considering strain energies, a model for the capping is presented.
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Atom-selective imaging of the GaAs(110) surface
R. M. Feenstra, Joseph A. Stroscio, J. Tersoff et al. · Physical Review Letters · 1987 · 613 citations
Inverted Electron-Hole Alignment in InAs-GaAs Self-Assembled Quantum Dots
P. W. Fry, I. E. Itskevich, D. J. Mowbray et al. · Physical Review Letters · 2000 · 523 citations · Full text