Distribution of the contact-potential difference local values over the gate area of MOS structures - Concepedia

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Distribution of the contact-potential difference local values over the gate area of MOS structures

17

Citations

5

References

2004

Year

H. M. Przewłocki, D. Brzezińska, Hisham Z. Massoud

Microelectronic Engineering

Device ModelingGate AreaElectrical EngineeringEngineeringTunneling MicroscopyPhysicsNanoelectronicsBias Temperature InstabilityCondensed Matter PhysicsApplied PhysicsMos StructuresMicroelectronicsSemiconductor Device

References

	Year	Citations

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